When dealing with deposition of layers a few nanometers thick, the process parameters are of great importance to the quality of the resultant coating. An often analysis of the produced coatings are necessary for maintaining high quality coatings with accurate properties. When developing processes for individual customers, analysis tools of high accuracy are of higest interest.
The coating service division of Polyteknik is equipped with a series of tools for analysis and characterization of the deposited coatings.
X-ray: For thickness measurements of layer stacks and material composition analysis
To check the composition of both the materials and the final coatings, an in-house X-ray fluorescence spectrometer is used. This x-ray tool is also used for thickness analysis of whole layer stacks post-deposition.
Ellipsometry: For thickness determination of optical transparent coatings
Both transparent and optical dense layer stacks can be analyzed. For low atomic-mass optical transparent coatings, spectroscopic elleipsometry is used for thickness determination and for refractive index measurements.
SEM: For surface analysis and general characterization
If the surface morphology of the coated products is of interest we have access to both regular scanning electron microscope (SEM) and SEM equipped with focused ion beam (FIB) column and EDX equipment for vertical analysis of interfaces, thicknesses, and local material composition.
During the first quarter of 2010 we expect to have installed an in-house field emission SEM for fast and precise sampe examination.
Contact angle measurements
Resistivity measurements of coatings - Keithly
For some products deposited with metallic conducting coatings, the resistivity of the final product is of high priority. To ensure that the coated product meet the customer´s requirements, we are using a high class sourcemeter to measure the resistivity post-deposition.
