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ANALYSIS & CHARACTERIZATION
X-RAY
thickness measurements of layer stacks and material composition analysis.
Ellipsometry
thickness determination of optical transparent coatings.
Profilometer
thickness, roughness, and stress measurement of coatings.
SEM
surface analysis and general characterization.
When dealing with deposition of layers a few nanometers thick, the process parameters are of great importance to the quality of the resultant coating. Frequent analyses of the produced coatings are necessary for maintaining high quality coatings with accurate properties. When developing processes for individual costumers, analysis tools of high accuracy are of highest importance.
The coating service division of Polyteknik is equipped with a series of tools for analysis and characterization of the deposited coatings.
To check the composition of both the deposition materials and the final coatings, an in-house X-ray fluorescence spectrometer is used. This x-ray tool is also used for thickness analysis of whole layer stacks after deposition. Both transparent and optical dense layer stacks can be analyzed. For low atomic-mass optical transparent coatings, spectroscopic ellipsometry is used for thickness determination and for refractive index measurements.
If the surface morphology of the coated product is of interest we have access to both regular scanning electron microscopes (SEM) and SEMs equipped with focused ion beam (FIB) column and EDX equipment for vertical analysis of interfaces, thickness', and local material composition.
For stress and roughness measurements of coatings, a Brooker profilometer is installed in-house. Information regarding the surface roughness of the substrates is also of interest before deposition of any layers. This is important e.g. if a certain resistance is needed for a specific product. For precise thickness analysis of some coatings and for thickness uniformity measurements, the profilometer is also used.
For some products deposited with metallic conducting coatings, the resistance of the final product is of high priority. To ensure that the coated product meets the customers requirements, we are using a high class sourcemeter to measure the resistance of the deposited layer.